Authors: Zhang, WD Zhang, JF Lalor, M Burton, D Groeseneken, G Degraeve, R

Citation: Wd. Zhang et al., On the mechanism of electron trap generation in gate oxides, MICROEL ENG, 59(1-4), 2001, pp. 89-94

Authors: Zhang, WD Zhang, JF Uren, MJ Groeseneken, G Degraeve, R Lalor, M Burton, D

Citation: Wd. Zhang et al., Dependence of energy distributions of interface states on stress conditions, MICROEL ENG, 59(1-4), 2001, pp. 95-99

Authors: Zhang, WD Zhang, JF Uren, MJ Groeseneken, G Degraeve, R Lalor, M Burton, D

Citation: Wd. Zhang et al., On the interface states generated under different stress conditions, APPL PHYS L, 79(19), 2001, pp. 3092-3094