Authors:
Breitenstein, O
Langenkamp, M
Lang, O
Schirrmacher, A
Citation: O. Breitenstein et al., Shunts due to laser scribing of solar cells evaluated by highly sensitive lock-in thermography, SOL EN MAT, 65(1-4), 2001, pp. 55-62
Authors:
Breitenstein, O
Langenkamp, M
Altmann, F
Katzer, D
Lindner, A
Eggers, H
Citation: O. Breitenstein et al., Microscopic lock-in thermography investigation of leakage sites in integrated circuits, REV SCI INS, 71(11), 2000, pp. 4155-4160