Authors:
DeVittorio, M
Coli, G
Rinaldi, R
Gigli, G
Cingolani, R
De Salvador, D
Berti, M
Drigo, A
Fucilli, F
Ligonzo, T
Augelli, V
Rizzi, A
Lantier, R
Freundt, D
Luth, H
Neubauer, B
Gerthsen, D
Citation: M. Devittorio et al., Photocurrent spectroscopy of GaN and AlGaN epilayers grown on 6H (0001) silicon carbide, SOL ST ELEC, 44(3), 2000, pp. 465-470
Citation: A. Rizzi et al., Boundary conditions and the macroscopic field at SiC/AlN and SiC/GaN heterostructures, PHYS ST S-A, 177(1), 2000, pp. 165-171
Authors:
Rizzi, A
Lantier, R
Monti, F
Luth, H
Della Sala, F
Di Carlo, A
Lugli, P
Citation: A. Rizzi et al., AlN and GaN epitaxial heterojunctions on 6H-SiC(0001): Valence band offsets and polarization fields, J VAC SCI B, 17(4), 1999, pp. 1674-1681
Authors:
Lantier, R
Boscherini, F
Rizzi, A
D'Acapito, F
Mobilio, S
Luth, H
Citation: R. Lantier et al., Direct evidence of spontaneous polarization effect in GaN grown on SiC(0001): Heterojunction electronic properties, PHYS ST S-A, 176(1), 1999, pp. 615-619
Authors:
Gerthsen, D
Neubauer, B
Dieker, C
Lantier, R
Rizzi, A
Luth, H
Citation: D. Gerthsen et al., Molecular beam epitaxy (MBE) growth and structural properties of GaN and AlN on 3C-SiC(0 0 1) substrates, J CRYST GR, 200(3-4), 1999, pp. 353-361
Authors:
Boscherini, F
Lantier, R
Rizzi, A
D'Acapito, F
Mobilio, S
Citation: F. Boscherini et al., Evidence for relaxed and high-quality growth of GaN on SiC(0001) (vol 74, pg 3308, 1999), APPL PHYS L, 75(2), 1999, pp. 304-304