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Results: 1
Recombination activity in directly bonded high resistivity silicon wafers measured by the photoconductance decay method
Authors:
Sarrabayrouse, G Lecerf, P Bielle-Daspet, D
Citation:
G. Sarrabayrouse et al., Recombination activity in directly bonded high resistivity silicon wafers measured by the photoconductance decay method, JPN J A P 1, 38(11), 1999, pp. 6181-6183
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