Citation: Jl. Lee et al., AlGaAs/InGaAs pseudomorphic high electron mobility transistor using Pd/Ge ohmic contact, JPN J A P 1, 40(3A), 2001, pp. 1188-1193
Citation: Kj. Choi et Jl. Lee, Surface states on n-type Al0.24Ga0.76As characterized by deep-level transient spectroscopy, J VAC SCI B, 19(3), 2001, pp. 615-621
Citation: Kj. Choi et Jl. Lee, Effects of hot-electron stress on electrical performances in AlGaAs/InGaAspseudomorphic high electron transistors, J ELEC MAT, 30(7), 2001, pp. 885-890
Authors:
Kim, JK
Kim, KJ
Kim, B
Kim, JN
Kwak, JS
Park, YJ
Lee, JL
Citation: Jk. Kim et al., Effects of surface treatment using aqua regia solution on the change of surface band bending of p-type GaN, J ELEC MAT, 30(3), 2001, pp. 129-133
Authors:
Kim, JK
Kim, CC
Cho, TS
Je, JH
Kwak, JS
Park, YJ
Lee, JL
Citation: Jk. Kim et al., Effects of surface treatments on the electrical and the microstructural changes of Pd contact an p-type GaN, J ELEC MAT, 30(3), 2001, pp. 170-174
Authors:
Lee, BY
Jung, SY
Lee, JL
Park, YJ
Paek, MC
Cho, KI
Citation: By. Lee et al., Reactive ion etching of vertical GaN mesas by the addition of CH4 to BCl3/H-2/Ar inductively coupled plasma, SEMIC SCI T, 16(6), 2001, pp. 471-473
Citation: Mt. Tsay et al., Application of evolutionary programming for economic dispatch of cogeneration systems under emission constraints, INT J ELEC, 23(8), 2001, pp. 805-812
Citation: Kj. Choi et Jl. Lee, Interpretation of transconductance dispersion in GaAs MESFET using deep level transient spectroscopy, IEEE DEVICE, 48(2), 2001, pp. 190-195
Citation: Jl. Lee et Si. Liu, Integrator and differentiator with time constant multiplication using current feedback amplifier, ELECTR LETT, 37(6), 2001, pp. 331-333
Authors:
Jang, HW
Kim, KH
Kim, JK
Hwang, SW
Yang, JJ
Lee, KJ
Son, SJ
Lee, JL
Citation: Hw. Jang et al., Low-resistance and thermally stable ohmic contact on p-type GaN using Pd/Ni metallization, APPL PHYS L, 79(12), 2001, pp. 1822-1824
Citation: Hw. Jang et al., Room-temperature Ohmic contact on n-type GaN with surface treatment using Cl-2 inductively coupled plasma, APPL PHYS L, 78(14), 2001, pp. 2015-2017
Citation: W. Wu et al., The relationship between alloying elements and retained austenite in martensitic stainless steel welds, SCR MATER, 42(11), 2000, pp. 1071-1076
Citation: Jl. Lee et al., Transparent Pt ohmic contact on p-type GaN with low resistivity using (NH4)(2)S-x treatment, EL SOLID ST, 3(1), 2000, pp. 53-55