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Results: 1-10 |
Results: 10
Fabrication of silicon aperture probes for scanning near-field optical microscopy by focused ion beam nano machining
Authors: Lehrer, C Frey, L Petersen, S Sulzbach, T Ohlsson, O Dziomba, T Danzebrink, HU Ryssel, H
Citation: C. Lehrer et al., Fabrication of silicon aperture probes for scanning near-field optical microscopy by focused ion beam nano machining, MICROEL ENG, 57-8, 2001, pp. 721-728
High-resolution constant-height imaging with apertured silicon cantilever probes
Authors: Dziomba, T Danzebrink, KU Lehrer, C Frey, L Sulzbach, T Ohlsson, O
Citation: T. Dziomba et al., High-resolution constant-height imaging with apertured silicon cantilever probes, J MICROSC O, 202, 2001, pp. 22-27
Field emitter array fabricated using focused ion and electron beam inducedreaction
Authors: Yavas, O Ochiai, C Takai, M Park, YK Lehrer, C Lipp, S Frey, L Ryssel, H Hosono, A Okuda, S
Citation: O. Yavas et al., Field emitter array fabricated using focused ion and electron beam inducedreaction, J VAC SCI B, 18(2), 2000, pp. 976-979
Impurity incorporation during beam assisted processing analyzed using nuclear microprobe
Authors: Park, YK Takai, M Lehrer, C Frey, L Ryssel, H
Citation: Yk. Park et al., Impurity incorporation during beam assisted processing analyzed using nuclear microprobe, NUCL INST B, 158(1-4), 1999, pp. 487-492
Investigation of Cu films by focused ion beam induced deposition using nuclear microprobe
Authors: Park, YK Takai, M Lehrer, C Frey, L Ryssel, H
Citation: Yk. Park et al., Investigation of Cu films by focused ion beam induced deposition using nuclear microprobe, NUCL INST B, 158(1-4), 1999, pp. 493-498
Comparison of beam-induced deposition using ion microprobe
Authors: Park, YK Nagai, T Takai, M Lehrer, C Frey, L Ryssel, H
Citation: Yk. Park et al., Comparison of beam-induced deposition using ion microprobe, NUCL INST B, 148(1-4), 1999, pp. 25-31
AFM and STM investigation of carbon nanotubes produced by high energy ion irradiation of graphite
Authors: Biro, LP Mark, GI Gyulai, J Havancsak, K Lipp, S Lehrer, C Frey, L Ryssel, H
Citation: Lp. Biro et al., AFM and STM investigation of carbon nanotubes produced by high energy ion irradiation of graphite, NUCL INST B, 147(1-4), 1999, pp. 142-147
Ion beam-treated silicon probes operated in transmission and cross-polarized reflection mode near-infrared scanning near-field optical microscopy (NIR-SNOM)
Authors: Dziomba, T Sulzbach, T Ohlsson, O Lehrer, C Frey, L Danzebrink, HU
Citation: T. Dziomba et al., Ion beam-treated silicon probes operated in transmission and cross-polarized reflection mode near-infrared scanning near-field optical microscopy (NIR-SNOM), SURF INT AN, 27(5-6), 1999, pp. 486-490
Nano-slit probes for near-field optical microscopy fabricated by focused ion beams
Authors: Danzebrink, HU Dziomba, T Sulzbach, T Ohlsson, O Lehrer, C Frey, L
Citation: Hu. Danzebrink et al., Nano-slit probes for near-field optical microscopy fabricated by focused ion beams, J MICROSC O, 194, 1999, pp. 335-339
Microprobe analysis of Pt films deposited by beam induced reaction
Authors: Park, YK Takai, M Lehrer, C Frey, L Ryssel, H
Citation: Yk. Park et al., Microprobe analysis of Pt films deposited by beam induced reaction, JPN J A P 1, 37(12B), 1998, pp. 7042-7046
Risultati: 1-10 |