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Results:
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Results: 1
Electrical reliability aspects of through the gate implanted MOS structures with thin oxides
Authors:
Jank, MPM Lemberger, M Bauer, AJ Frey, L Ryssel, H
Citation:
Mpm. Jank et al., Electrical reliability aspects of through the gate implanted MOS structures with thin oxides, MICROEL REL, 41(7), 2001, pp. 987-990
Risultati:
1-1
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