Authors:
van Driel, J
de Boer, FR
Lenssen, KMH
Coehoorn, R
Citation: J. Van Driel et al., Exchange biasing by Ir19Mn81: Dependence on temperature, microstructure and antiferromagnetic layer thickness, J APPL PHYS, 88(2), 2000, pp. 975-982
Authors:
Lenssen, KMH
Kuiper, AET
van den Broek, JJ
van der Rijt, RAF
van Loon, A
Citation: Kmh. Lenssen et al., Sensor properties of a robust giant magnetoresistance material system at elevated temperatures, J APPL PHYS, 87(9), 2000, pp. 6665-6667