Authors:
Tosoratti, N
Fastampa, R
Giura, M
Lenzi, V
Sarti, S
Silva, E
Citation: N. Tosoratti et al., A microwave broadband technique to measure the complex resistivity of HTS thin films, IEEE APPL S, 11(1), 2001, pp. 3082-3085
Authors:
Tosoratti, N
Fastampa, R
Giura, M
Lenzi, V
Sarti, S
Silva, E
Citation: N. Tosoratti et al., Two techniques for broadband measurement of the surface impedance of high critical temperature superconducting thin films, INT J MOD B, 14(25-27), 2000, pp. 2926-2931