Authors: Forster, S Lequeu, T Jerisian, R

Citation: S. Forster et al., Operation of power semiconductors under transient thermal conditions: thermal fatigue reliability and mechanical aspects, MICROEL REL, 41(9-10), 2001, pp. 1677-1682

Authors: Forster, S Lequeu, T Jerisian, R Hoffmann, A

Citation: S. Forster et al., 3-D analysis of the breakdown localised defects of ACS (TM) through a triac study, MICROEL REL, 40(8-10), 2000, pp. 1695-1700