ACNP - Italian Periodicals Catalogue

AAAAAA

ITA
ENG

Results: 1-12 |

Results: 12

Determination of the dielectric function of porous silicon by high-order laser-harmonic radiation

Authors: De Filippo, F de Lisio, C Maddalena, P Lerondel, G Yao, T Altucci, C

Citation: F. De Filippo et al., Determination of the dielectric function of porous silicon by high-order laser-harmonic radiation, APPL PHYS A, 73(6), 2001, pp. 737-740

Near-field optics: Direct observation of the field enhancement below an apertureless probe using a photosensitive polymer

Authors: H'dhili, F Bachelot, R Lerondel, G Barchiesi, D Royer, P

Citation: F. H'Dhili et al., Near-field optics: Direct observation of the field enhancement below an apertureless probe using a photosensitive polymer, APPL PHYS L, 79(24), 2001, pp. 4019-4021

Superlattices as characterisation tool for the beginning of PS formation

Authors: Midellino, D Lerondel, G Parisini, A Rossi, AM Boarino, L Amato, G

Citation: D. Midellino et al., Superlattices as characterisation tool for the beginning of PS formation, J POROUS MA, 7(1-3), 2000, pp. 373-376

TEM characterisation of porous silicon

Authors: Parisini, A Angelucci, R Dori, L Poggi, A Maccagnani, P Cardinali, GC Amato, G Lerondel, G Midellino, D

Citation: A. Parisini et al., TEM characterisation of porous silicon, MICRON, 31(3), 2000, pp. 223-230

Low dimensional porous silicon superlattices

Authors: Amato, G Boarino, L Rossi, AM Lerondel, G Parisini, A

Citation: G. Amato et al., Low dimensional porous silicon superlattices, MAT SCI E B, 69, 2000, pp. 48-52

Porous silicon nanocracking

Authors: Lerondel, G Amato, G Parisini, A Boarino, L

Citation: G. Lerondel et al., Porous silicon nanocracking, MAT SCI E B, 69, 2000, pp. 161-166

NO2 monitoring at room temperature by a porous silicon gas sensor

Authors: Boarino, L Baratto, C Geobaldo, F Amato, G Comini, E Rossi, AM Faglia, G Lerondel, G Sberveglieri, G

Citation: L. Boarino et al., NO2 monitoring at room temperature by a porous silicon gas sensor, MAT SCI E B, 69, 2000, pp. 210-214

Direct determination of the absorption of porous silicon by photocurrent measurement at low temperature

Authors: Lerondel, G Madeore, F Romestain, R Muller, F

Citation: G. Lerondel et al., Direct determination of the absorption of porous silicon by photocurrent measurement at low temperature, THIN SOL FI, 366(1-2), 2000, pp. 216-224

Measurement of porous silicon dielectric constant by VUV laser harmonic radiation

Authors: De Filippo, F de Lisio, C Maddalena, P Lerondel, G Altucci, C

Citation: F. De Filippo et al., Measurement of porous silicon dielectric constant by VUV laser harmonic radiation, PHYS ST S-A, 182(1), 2000, pp. 261-266

Properties of metal bolometers fabricated on porous silicon

Authors: Monticone, E Boarino, L Lerondel, G Steni, R Amato, G Lacquaniti, V

Citation: E. Monticone et al., Properties of metal bolometers fabricated on porous silicon, APPL SURF S, 142(1-4), 1999, pp. 267-271

Micromachining of silicon with a proton microbeam

Authors: Polesello, P Manfredotti, C Fizzotti, F Lu, R Vittone, E Lerondel, G Rossi, AM Amato, G Boarino, L Galassini, S Jaksic, M Pastuovic, Z

Citation: P. Polesello et al., Micromachining of silicon with a proton microbeam, NUCL INST B, 158(1-4), 1999, pp. 173-178

Fresnel coefficients of a rough interface

Authors: Lerondel, G Romestain, R

Citation: G. Lerondel et R. Romestain, Fresnel coefficients of a rough interface, APPL PHYS L, 74(19), 1999, pp. 2740-2742

Risultati: 1-12 |