Authors: Lu, YM Leu, IC

Citation: Ym. Lu et Ic. Leu, Microstructural study of residual stress in chemically vapor deposited beta-SiC, SURF COAT, 124(2-3), 2000, pp. 262-265

Authors: Lu, YM Leu, IC

Citation: Ym. Lu et Ic. Leu, Qualitative study of beta silicon carbide residual stress by Raman spectroscopy, THIN SOL FI, 377, 2000, pp. 389-393

Authors: Leu, IC Hon, MH Lu, YM

Citation: Ic. Leu et al., Chemical vapor deposition of silicon carbide whiskers activated by elemental nickel, J ELCHEM SO, 146(1), 1999, pp. 184-188