Authors: Brennan, S Munkholm, A Leung, OS Nix, WD

Citation: S. Brennan et al., X-ray measurements of the depth dependence of stress in gold films, PHYSICA B, 283(1-3), 2000, pp. 125-129

Authors: Leung, OS Munkholm, A Brennan, S Nix, WD

Citation: Os. Leung et al., A search for strain gradients in gold thin films on substrates using x-raydiffraction, J APPL PHYS, 88(3), 2000, pp. 1389-1396