Authors: Peng, CB Liang, RG Erwin, JK Bletscher, W Nagata, K Mansuripur, M

Citation: Cb. Peng et al., Determination of optical constants of thin films and multilayer stacks by use of concurrent reflectance, transmittance, and ellipsometric measurements, APPL OPTICS, 40(28), 2001, pp. 5088-5099

Authors: Liang, RG Li, LF Saito, K Mansuripur, M

Citation: Rg. Liang et al., Polarization dependence of readout signals from periodic one-dimensional arrays of magnetic domains in magneto-optical media and crystalline-amorphous line pairs in phase-change media of optical recording, APPL OPTICS, 40(14), 2001, pp. 2323-2330

Authors: Tesar, J Liang, RG

Citation: J. Tesar et Rg. Liang, Optical modeling combining geometrical ray tracing and physical-optics software, OPT ENG, 39(7), 2000, pp. 1845-1849