Authors:
Peng, CB
Liang, RG
Erwin, JK
Bletscher, W
Nagata, K
Mansuripur, M
Citation: Cb. Peng et al., Determination of optical constants of thin films and multilayer stacks by use of concurrent reflectance, transmittance, and ellipsometric measurements, APPL OPTICS, 40(28), 2001, pp. 5088-5099
Citation: Rg. Liang et al., Polarization dependence of readout signals from periodic one-dimensional arrays of magnetic domains in magneto-optical media and crystalline-amorphous line pairs in phase-change media of optical recording, APPL OPTICS, 40(14), 2001, pp. 2323-2330