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Citation: Te. Lipe et al., Improvements in the NIST cryogenic thermal transfer standard, IEEE INSTR, 50(2), 2001, pp. 326-329

Authors: Wunsch, TF Kinard, JR Manginell, RP Solomon, OM Lipe, TE Jungling, KC

Citation: Tf. Wunsch et al., A new fabrication process for planar thin-film multijunction thermal converters, IEEE INSTR, 50(2), 2001, pp. 330-332

Authors: Filipski, PS van Mullem, CJ Janik, D Klonz, M Kinard, JR Lipe, TE Waltrip, BC

Citation: Ps. Filipski et al., Comparison of high-frequency AC-DC voltage transfer standards at NRC, VSL,PTB, and NIST, IEEE INSTR, 50(2), 2001, pp. 349-352

Authors: Burroughs, CJ Benz, SP Hamilton, CA Harvey, TE Kinard, JR Lipe, TE Sasaki, H

Citation: Cj. Burroughs et al., Thermoelectric transfer difference of thermal converters measured with a Josephson source, IEEE INSTR, 48(2), 1999, pp. 282-284