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Citation: Sv. Litvinenko et al., Application of Dynamical Optical Reflection Thermography (DORT) for detecting of dark current inhomogeneity in semiconductor devices, APPL SURF S, 137(1-4), 1999, pp. 45-49

Authors: Vovchenko, LL Matsui, LY Litvinenko, SV Kotsyuba, AN

Citation: Ll. Vovchenko et al., Electrical resistivity of graphite intercalation compounds with SbCl5 and ICl near phase transitions, INORG MATER, 34(12), 1998, pp. 1222-1226