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Results:
1-2
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Results: 2
Laser diode COFD analysis by thermoreflectance microscopy
Authors:
Dilhaire, S Grauby, S Jorez, S Lopez, LDP Schaub, E Claeys, W
Citation:
S. Dilhaire et al., Laser diode COFD analysis by thermoreflectance microscopy, MICROEL REL, 41(9-10), 2001, pp. 1597-1601
Measurement of the thermomechanical strain of electronic devices by shearography
Authors:
Dilhaire, S Jorez, S Cornet, A Lopez, LDP Claeys, W
Citation:
S. Dilhaire et al., Measurement of the thermomechanical strain of electronic devices by shearography, MICROEL REL, 40(8-10), 2000, pp. 1509-1514
Risultati:
1-2
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