Authors: Loriette, V Boccara, AC

Citation: V. Loriette et Ac. Boccara, A common path interferometer for testing the optical thickness of possiblybirefringent transparent substrates, MEAS SCI T, 12(2), 2001, pp. 201-212

Authors: Braxmaier, C Pradl, O Muller, H Peters, A Mlynek, J Loriette, V Schiller, S

Citation: C. Braxmaier et al., Proposed test of the time independence of the fundamental constants alpha and m(e)/m(p) using monolithic resonators - art. no. 042001, PHYS REV D, 6404(4), 2001, pp. 2001

Authors: Loriette, V

Citation: V. Loriette, Point defect 3D mapping in thick transparent substrates, J OPT A-P A, 2(2), 2000, pp. 70-76

Authors: Benabid, F Notcutt, M Loriette, V Ju, L Blair, DG

Citation: F. Benabid et al., X-ray induced absorption of high-purity sapphire and investigation of the origin of the residual absorption at 1064 nm, J PHYS D, 33(6), 2000, pp. 589-594

Authors: de Villele, G Loriette, V

Citation: G. De Villele et V. Loriette, Birefringence imaging with imperfect benches: application to large-scale birefringence measurements, APPL OPTICS, 39(22), 2000, pp. 3864-3874