Authors:
MADEMANN D
RAUPACH L
WEISSBRODT P
HACKER E
KAISER U
KAISER N
Citation: D. Mademann et al., INVESTIGATION OF THIN FLUORIDE FILMS FOR OPTICAL APPLICATIONS BY SURFACE ANALYTICAL METHODS AND ELECTRON-MICROSCOPY, Fresenius' journal of analytical chemistry, 346(1-3), 1993, pp. 173-176
Citation: S. Uhlemann et al., THEORY AND IMPROVEMENTS FOR SNMS DEPTH PROFILING WITH INA3, Fresenius' journal of analytical chemistry, 346(1-3), 1993, pp. 374-379