Authors:
BELUMARIAN A
SERBANESCU MD
MANAILA R
IVANOV E
MALIS O
DEVENYI A
Citation: A. Belumarian et al., CONDUCTIVITY OF RF-SPUTTERED NI-100-X-SI-X THIN-FILMS WITH 3-LESS-THAN-OR-EQUAL-TO-X-LESS-THAN-OR-EQUAL-TO-77 AT.PERCENT, Thin solid films, 259(1), 1995, pp. 105-112
Citation: O. Malis et al., EFFECT OF INTERGROWTH DEFECTS ON THE X-RAY-DIFFRACTION PATTERN .2. A CASE-STUDY OF BI-BASED SUPERCONDUCTORS, Physica status solidi. a, Applied research, 147(2), 1995, pp. 325-333
Citation: R. Manaila et al., EFFECT OF INTERGROWTH DEFECTS ON THE X-RAY-DIFFRACTION PATTERN, Physica status solidi. a, Applied research, 147(1), 1995, pp. 31-43