Authors: SCHOTT C MANIC D POPOVIC RS

Citation: C. Schott et al., MICROSYSTEM FOR HIGH-ACCURACY 3-D MAGNETIC-FIELD MEASUREMENTS, Sensors and actuators. A, Physical, 67(1-3), 1998, pp. 133-137

Authors: MANIC D HADDAB Y POPOVIC RS

Citation: D. Manic et al., ON-WAFER HEATING TESTS TO STUDY STABILITY OF SILICON DEVICES, Microelectronics and reliability, 38(6-8), 1998, pp. 1069-1073

Authors: HADDAB Y MANIC D POPOVIC RS

Citation: Y. Haddab et al., PERSISTENT PHOTOCONDUCTIVITY AS A TOOL FOR MONITORING OXIDE CLUSTER CONCENTRATION IN SILICON-WAFERS, Microelectronics and reliability, 38(4), 1998, pp. 511-514

Authors: HADDAB Y MANIC D POPOVIC RS

Citation: Y. Haddab et al., AN ON-WATER TEST STRUCTURE TO MEASURE THE EFFECT OF THERMALLY-INDUCEDSTRESS ON SILICON DEVICES, Microelectronics and reliability, 37(10-11), 1997, pp. 1441-1444