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Results: 1-13 |
Results: 13
PHOTON-INDUCED LOCALIZATION AND FINAL-STATE CORRELATION-EFFECTS IN OPTICALLY ABSORBING MATERIALS
Authors: ASPNES DE MANTESE L BELL KA ROSSOW U
Citation: De. Aspnes et al., PHOTON-INDUCED LOCALIZATION AND FINAL-STATE CORRELATION-EFFECTS IN OPTICALLY ABSORBING MATERIALS, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 16(4), 1998, pp. 2367-2372
LINESHAPES OF SURFACE-INDUCED OPTICAL ANISOTROPY SPECTRA MEASURED BY RDS RAS/
Authors: ROSSOW U MANTESE L ASPNES DE
Citation: U. Rossow et al., LINESHAPES OF SURFACE-INDUCED OPTICAL ANISOTROPY SPECTRA MEASURED BY RDS RAS/, Applied surface science, 123, 1998, pp. 237-242
SYSTEMATIC DIFFERENCES AMONG NOMINAL REFERENCE DIELECTRIC FUNCTION SPECTRA FOR CRYSTALLINE SI AS DETERMINED BY SPECTROSCOPIC ELLIPSOMETRY
Authors: BELL KA MANTESE L ROSSOW U ASPNES DE
Citation: Ka. Bell et al., SYSTEMATIC DIFFERENCES AMONG NOMINAL REFERENCE DIELECTRIC FUNCTION SPECTRA FOR CRYSTALLINE SI AS DETERMINED BY SPECTROSCOPIC ELLIPSOMETRY, Thin solid films, 313, 1998, pp. 161-166
INTERPRETATION OF CRITICAL-POINT ENERGY SHIFTS IN CRYSTALLINE SI BY NEAR-SURFACE LOCALIZATION OF EXCITED ELECTRONIC STATES
Authors: MANTESE L BELL KA ROSSOW U ASPNES DE
Citation: L. Mantese et al., INTERPRETATION OF CRITICAL-POINT ENERGY SHIFTS IN CRYSTALLINE SI BY NEAR-SURFACE LOCALIZATION OF EXCITED ELECTRONIC STATES, Thin solid films, 313, 1998, pp. 557-560
EVIDENCE OF NEAR-SURFACE LOCALIZATION OF EXCITED ELECTRONIC STATES INCRYSTALLINE SI
Authors: MANTESE L BELL KA ROSSOW U ASPNES DE
Citation: L. Mantese et al., EVIDENCE OF NEAR-SURFACE LOCALIZATION OF EXCITED ELECTRONIC STATES INCRYSTALLINE SI, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 15(4), 1997, pp. 1196-1200
SURFACE AND INTERFACE EFFECTS ON ELLIPSOMETRIC SPECTRA OF CRYSTALLINESI
Authors: BELL KA MANTESE L ROSSOW U ASPNES DE
Citation: Ka. Bell et al., SURFACE AND INTERFACE EFFECTS ON ELLIPSOMETRIC SPECTRA OF CRYSTALLINESI, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 15(4), 1997, pp. 1205-1211
INTERPRETATION OF SURFACE-INDUCED OPTICAL ANISOTROPY OF CLEAN, HYDROGENATED, AND OXIDIZED VICINAL SILICON SURFACES INVESTIGATED BY REFLECTANCE-DIFFERENCE SPECTROSCOPY
Authors: ROSSOW U MANTESE L ASPNES DE
Citation: U. Rossow et al., INTERPRETATION OF SURFACE-INDUCED OPTICAL ANISOTROPY OF CLEAN, HYDROGENATED, AND OXIDIZED VICINAL SILICON SURFACES INVESTIGATED BY REFLECTANCE-DIFFERENCE SPECTROSCOPY, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(4), 1996, pp. 3070-3074
SURFACE-INDUCED OPTICAL ANISOTROPY OF OXIDIZED, CLEAN, AND HYDROGENATED VICINAL SI(001) SURFACES
Authors: MANTESE L ROSSOW U ASPNES DE
Citation: L. Mantese et al., SURFACE-INDUCED OPTICAL ANISOTROPY OF OXIDIZED, CLEAN, AND HYDROGENATED VICINAL SI(001) SURFACES, Applied surface science, 107, 1996, pp. 35-41
HYDROGENATED AND OXIDIZED VICINAL SI(001) SURFACES INVESTIGATED BY REFLECTANCE-DIFFERENCE SPECTROSCOPY
Authors: ROSSOW U MANTESE L YASUDA T ASPNES DE
Citation: U. Rossow et al., HYDROGENATED AND OXIDIZED VICINAL SI(001) SURFACES INVESTIGATED BY REFLECTANCE-DIFFERENCE SPECTROSCOPY, Applied surface science, 104, 1996, pp. 137-140
OPTICAL CHARACTERIZATION OF SURFACES DURING EPITAXIAL-GROWTH USING RDS AND GIXS
Authors: KAMIYA I MANTESE L ASPNES DE KISKER DW FUOSS PH STEPHENSON GB BRENNAN S
Citation: I. Kamiya et al., OPTICAL CHARACTERIZATION OF SURFACES DURING EPITAXIAL-GROWTH USING RDS AND GIXS, Journal of crystal growth, 163(1-2), 1996, pp. 67-77
SURFACE-INDUCED OPTICAL ANISOTROPIES OF SINGLE-DOMAIN (2X1) RECONSTRUCTED (001)SI AND (001)GE SURFACES
Authors: YASUDA T MANTESE L ROSSOW U ASPNES DE
Citation: T. Yasuda et al., SURFACE-INDUCED OPTICAL ANISOTROPIES OF SINGLE-DOMAIN (2X1) RECONSTRUCTED (001)SI AND (001)GE SURFACES, Physical review letters, 74(17), 1995, pp. 3431-3434
INVESTIGATION OF THE RELATIONSHIP BETWEEN REFLECTANCE DIFFERENCE SPECTROSCOPY AND SURFACE-STRUCTURE USING GRAZING-INCIDENCE X-RAY-SCATTERING
Authors: KISKER DW STEPHENSON GB KAMIYA I FUOSS PH ASPNES DE MANTESE L BRENNAN S
Citation: Dw. Kisker et al., INVESTIGATION OF THE RELATIONSHIP BETWEEN REFLECTANCE DIFFERENCE SPECTROSCOPY AND SURFACE-STRUCTURE USING GRAZING-INCIDENCE X-RAY-SCATTERING, Physica status solidi. a, Applied research, 152(1), 1995, pp. 9-21
SYNTHESIS AND CHARACTERIZATION OF PB (ZRXTI1-X)O3 THIN-FILMS PRODUCEDBY AN AUTOMATED LASER ABLATION DEPOSITION TECHNIQUE
Authors: AUCIELLO O MANTESE L DUARTE J CHEN X ROU SH KINGON AI SCHREINER AF KRAUSS AR
Citation: O. Auciello et al., SYNTHESIS AND CHARACTERIZATION OF PB (ZRXTI1-X)O3 THIN-FILMS PRODUCEDBY AN AUTOMATED LASER ABLATION DEPOSITION TECHNIQUE, Journal of applied physics, 73(10), 1993, pp. 5197-5207
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