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Results: 1
PICOSECOND NONLINEAR REFRACTION MEASUREMENT IN SINGLE-BEAM OPEN Z-SCAN BY CHARGE-COUPLED-DEVICE IMAGE-PROCESSING
Authors:
MARCANO AO MAILLOTTE H GINDRE D METIN D
Citation:
Ao. Marcano et al., PICOSECOND NONLINEAR REFRACTION MEASUREMENT IN SINGLE-BEAM OPEN Z-SCAN BY CHARGE-COUPLED-DEVICE IMAGE-PROCESSING, Optics letters, 21(2), 1996, pp. 101-103
Risultati:
1-1
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