Authors: ERMOLIEFF A CHARRASIN V MARTHON S PIAGUET J DELEONIBUS S

Citation: A. Ermolieff et al., EXPERIMENTAL REQUIREMENTS FOR SURFACE-CHARGE SPECTROSCOPY (SCS) MEASUREMENTS - EXAMPLES OF SCS MEASUREMENTS ON HIGH-RESISTIVITY AND LOW-RESISTIVITY SI SAMPLES, Surface and interface analysis, 23(3), 1995, pp. 137-147

Authors: ERMOLIEFF A DELEONIBUS S MARTHON S BLANCHARD B PIAGUET J

Citation: A. Ermolieff et al., STUDY OF SIO2 SI INTERFACE STATES IN MOS DEVICES BY SURFACE-CHARGE SPECTROSCOPY - APPLICATION TO RAPID THERMAL NITRIDATION OF SILICON/, Journal of electron spectroscopy and related phenomena, 67(3), 1994, pp. 409-416

Authors: ERMOLIEFF A MARTHON S GRANGES H PIAGUET J PIERRE F

Citation: A. Ermolieff et al., X-RAY PHOTOEMISSION-STUDY OF VARIOUS POLYIMIDE CLEANING PROCESSES BEFORE METAL-DEPOSITION, Thin solid films, 239(2), 1994, pp. 220-224