Authors: MARIUCCI L FORTUNATO G CARLUCCIO R PECORA A GIOVANNINI S MASSUSSI F COLALONGO L VALDINOCI M

Citation: L. Mariucci et al., DETERMINATION OF HOT-CARRIER-INDUCED INTERFACE STATE DENSITY IN POLYCRYSTALLINE SILICON THIN-FILM TRANSISTORS, Journal of applied physics, 84(4), 1998, pp. 2341-2348

Authors: MARIUCCI L GIACOMETTI F PECORA A MASSUSSI F FORTUNATO G VALDINOCI M COLALONGO L

Citation: L. Mariucci et al., NUMERICAL-ANALYSIS OF ELECTRICAL CHARACTERISTICS OF POLYSILICON THIN-FILM TRANSISTORS FABRICATED BY EXCIMER-LASER CRYSTALLIZATION, Electronics Letters, 34(9), 1998, pp. 924-926