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Results: 1-25 | 26-28 |
Results: 26-28/28
PASSIVE FILM COMPOSITION AND PITTING BEHAVIOR OF FE-25CR-11NB STUDIEDBY SCANNING AUGER MICROSCOPY
Authors: HUBSCHMID C MATHIEU HJ LANDOLT D
Citation: C. Hubschmid et al., PASSIVE FILM COMPOSITION AND PITTING BEHAVIOR OF FE-25CR-11NB STUDIEDBY SCANNING AUGER MICROSCOPY, Surface and interface analysis, 20(9), 1993, pp. 755-760
INTERLABORATORY COMPARISON OF THE DEPTH RESOLUTION IN SPUTTER DEPTH PROFILING OF NI CR MULTILAYERS WITH AND WITHOUT SAMPLE ROTATION USING AES, XPS AND SIMS/
Authors: HOFMANN S ZALAR A CIRLIN EH VAJO JJ MATHIEU HJ PANJAN P
Citation: S. Hofmann et al., INTERLABORATORY COMPARISON OF THE DEPTH RESOLUTION IN SPUTTER DEPTH PROFILING OF NI CR MULTILAYERS WITH AND WITHOUT SAMPLE ROTATION USING AES, XPS AND SIMS/, Surface and interface analysis, 20(8), 1993, pp. 621-626
XPS STUDY OF IN-SITU OXIDATION OF AN FE-CR ALLOY BY LOW-PRESSURE OXYGEN IN THE PRESENCE OF WATER-VAPOR
Authors: PALACIO C MATHIEU HJ STAMBOULI V LANDOLT D
Citation: C. Palacio et al., XPS STUDY OF IN-SITU OXIDATION OF AN FE-CR ALLOY BY LOW-PRESSURE OXYGEN IN THE PRESENCE OF WATER-VAPOR, Surface science, 295(1-2), 1993, pp. 251-262
Risultati: 1-25 | 26-28 |