Authors:
MAZUMDER MK
TERAMOTO A
SEKINE M
KAWAZU S
KOYAMA H
Citation: Mk. Mazumder et al., IMPROVED RELIABILITY OF NO TREATED NH3-NITRIDED OXIDE WITH REGARD TO O-2 ANNEALING, Solid-state electronics, 42(6), 1998, pp. 921-924
Citation: Va. Philip et al., EFFECT OF SURFACE-TREATMENT ON THE RESPIRABLE FRACTIONS OF PLGA MICROSPHERES FORMULATED FOR DRY POWDER INHALERS, International journal of pharmaceutics, 151(2), 1997, pp. 165-174
Authors:
MAZUMDER MK
WANKUM DL
SIMS RA
MOUNTAIN JR
CHEN H
PETTIT P
CHASER T
Citation: Mk. Mazumder et al., INFLUENCE OF POWDER PROPERTIES ON THE PERFORMANCE OF ELECTROSTATIC COATING PROCESS, Journal of electrostatics, 40-1, 1997, pp. 369-374
Citation: Va. Philip et al., E-SPART ANALYSIS OF POLY(D,L-LACTIDE-CO-GLYCOLIDE) MICROSPHERES FORMULATED FOR DRY POWDER AEROSOLS, Particulate science and technology, 15(3-4), 1997, pp. 303-316
Citation: Va. Philip et al., ELECTROSTATIC CHARGE AND PARTICLE-SIZE ANALYSIS OF POLY (D,L-LACTIDE-CO-GLYCOLIDE) MICROSPHERES FORMULATED FOR DRY POWDER AEROSOLS, Particulate science and technology, 15(3), 1997, pp. 245-261
Citation: Y. Takakuwa et al., SURFACE ADSORBATE RELATED NUCLEATION OF CRYSTALLOGRAPHIC DEFECT IN CHEMICAL-VAPOR-DEPOSITION OF SILICON WITH DICHLOROSILANE, Applied surface science, 117, 1997, pp. 88-93
Authors:
MAZUMDER MK
KOBAYASHI K
OGATA T
MITSUHASHI J
MASHIKO Y
KAWAZU S
SEKINE M
KOYAMA H
YASUOKA A
Citation: Mk. Mazumder et al., IMPROVED RELIABILITY OF WET OXIDIZED NITRIDE MOS CAPACITORS IN COMPARISON TO RTP N2O OXIDIZED NITRIDE FILMS, Solid-state electronics, 41(5), 1997, pp. 749-755
Authors:
MAZUMDER MK
KOBAYASHI K
OGATA T
MITSUHASHI JI
MASHIKO Y
KAWAZU S
SEKINE M
KOYAMA H
YASUOKA A
Citation: Mk. Mazumder et al., NITRIDE THICKNESS DEPENDENCE OF TRAP GENERATION AND NEGATIVE STRESS-INDUCED CURRENT IN OXIDIZED NITRIDE FILMS (LESS-THAN-5 NM), Solid-state electronics, 41(4), 1997, pp. 613-617
Authors:
MAZUMDER MK
TERAMOTO A
KATSUMATA M
SEKINE M
KAWAZU S
KOYAMA H
Citation: Mk. Mazumder et al., OXIDE THICKNESS DEPENDENCE OF NITRIDATION EFFECTS ON TDDB CHARACTERISTICS, Microelectronics and reliability, 37(10-11), 1997, pp. 1521-1524
Authors:
CHEN H
SIMS RA
MOUNTAIN JR
BURNSIDE G
REDDY RN
MAZUMDER MK
GATLIN B
Citation: H. Chen et al., POWDER COATING PROCESS PARAMETERS FOR A TRANSFER EFFICIENCY MODEL, Particulate science and technology, 14(3), 1996, pp. 239-254
Citation: Jr. Mountain et Mk. Mazumder, TRANSFER EFFICIENCY ENHANCEMENT OF POWER COATING APPLICATION USING RESPONSE-SURFACE METHODOLOGY, Particulate science and technology, 14(3), 1996, pp. 255-266
Citation: Hy. Sun et al., CARBONACEOUS AEROSOLS SINGLE SCATTERING ALBEDO AND EFFECT ON WEATHER HEATING, Particulate science and technology, 14(1), 1996, pp. 43-58
Citation: S. Banerjee et Mk. Mazumder, ADHESION OF CHARGED POWDERS TO A METAL-SURFACE IN THE POWDER COATING PROCESS, IEEE transactions on industry applications, 32(6), 1996, pp. 1243-1249
Authors:
MAZUMDER MK
KOBAYASHI K
MASHIKO Y
KOYAMA H
Citation: Mk. Mazumder et al., NEGATIVE STRESS-INDUCED CURRENT IN OXIDIZED NITRIDE LAYERS OF DIFFERENT NITRIDE THICKNESSES (LESS-THAN-5 NM), Solid-state electronics, 39(3), 1996, pp. 349-353
Authors:
MAZUMDER MK
KOBAYASHI K
OGATA T
MITSUHASHI J
MASHIKO Y
KOYAMA H
Citation: Mk. Mazumder et al., CONDUCTION AND CHARGE-TRAPPING CHARACTERISTICS OF MOS CAPACITORS WITHOXIDIZED NITRIDE FILMS OF DIFFERENT NITRIDE THICKNESSES UNDER POSITIVE STRESS BIAS, Journal of the Electrochemical Society, 143(1), 1996, pp. 368-373
Authors:
MAZUMDER MK
KATAYAMA T
KOBAYASHI K
MASHIKO Y
KOYAMA H
YASUOKA A
Citation: Mk. Mazumder et al., EFFECTS OF THE OXIDATION PROCESS ON THE ELECTRICAL CHARACTERISTICS OFOXIDIZED NITRIDE FILMS, Applied physics letters, 69(8), 1996, pp. 1140-1142
Authors:
MAZUMDER MK
MASHIKO Y
KOYAMA MH
TAKAKUWA Y
MIYAMOTO N
Citation: Mk. Mazumder et al., GENERATION KINETICS OF PYRAMIDAL HILLOCK AND CRYSTALLOGRAPHIC DEFECT ON SI(111) VICINAL SURFACES GROWN WITH SIH2CL2, Journal of crystal growth, 155(3-4), 1995, pp. 183-192
Authors:
MAZUMDER MK
MASHIKO Y
KOYAMA H
TAKAKUWA Y
MIYAMOTO N
Citation: Mk. Mazumder et al., VARIATION OF SIZE AND DENSITY OF PYRAMIDAL HILLOCK DURING EPITAXIAL-GROWTH OF SILICON USING DICHLOROSILANE GAS, Journal of the Electrochemical Society, 142(11), 1995, pp. 3956-3961
Authors:
MAZUMDER MK
BANERJEE S
WARE RE
MU C
KAYA N
HUANG CC
Citation: Mk. Mazumder et al., CHARACTERIZATION OF TRIBOCHARGING PROPERTIES OF POWDER PAINT, IEEE transactions on industry applications, 30(2), 1994, pp. 365-369
Authors:
MAZUMDER MK
KOBAYASHI K
MITSUHASHI J
KOYAMA H
Citation: Mk. Mazumder et al., STRESS-INDUCED CURRENT IN NITRIDE AND OXIDIZED NITRIDE THIN-FILMS, I.E.E.E. transactions on electron devices, 41(12), 1994, pp. 2417-2422
Citation: Y. Takakuwa et al., GROWTH DEFECT OBSERVATION WITH PYRAMIDAL HILLOCK AND REDUCTION BY PHOTOEXCITED HYDROGEN IN SI CVD WITH SIH2CL2, Journal of the Electrochemical Society, 141(9), 1994, pp. 2567-2572