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Results: 1
PRELIMINARY INVESTIGATION OF THE KINETICS OF POSTOXIDATION RAPID THERMAL ANNEAL INDUCED HOLE-TRAP-PRECURSOR FORMATION IN MICROELECTRONIC SIO2-FILMS
Authors:
CONLEY JF LENAHAN PM MCARTHUR WF
Citation:
Jf. Conley et al., PRELIMINARY INVESTIGATION OF THE KINETICS OF POSTOXIDATION RAPID THERMAL ANNEAL INDUCED HOLE-TRAP-PRECURSOR FORMATION IN MICROELECTRONIC SIO2-FILMS, Applied physics letters, 73(15), 1998, pp. 2188-2190
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