Authors:
JORDAN C
FEWER DT
DONEGAN JF
LOGUE FP
MCCABE EM
HUYNH A
TANIGUCHI S
HINO T
NAKANO K
ISHIBASHI A
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Authors:
JORDAN C
FEWER DT
DONEGAN JF
MCCABE EM
HUYNH A
LOGUE FP
TANIGUCHI S
HINO T
NAKANO K
ISHIBASHI A
Citation: C. Jordan et al., DEFECT ANNEALING IN A II-VI LASER-DIODE STRUCTURE UNDER INTENSE OPTICAL-EXCITATION, Applied physics letters, 72(2), 1998, pp. 194-196
Citation: Dt. Fewer et al., LASER SOURCES IN DIRECT-VIEW-SCANNING, TANDEM-SCANNING, OR NIPKOW-DISK-SCANNING CONFOCAL MICROSCOPY, Applied optics, 37(2), 1998, pp. 380-385
Citation: Sj. Hewlett et al., INFLUENCE OF SOURCE COHERENCE AND APERTURE DISTRIBUTION ON THE IMAGING PROPERTIES IN DIRECT-VIEW MICROSCOPY, Journal of the Optical Society of America. A, Optics, image science,and vision., 14(5), 1997, pp. 1066-1075
Citation: Dt. Fewer et al., DIRECT-VIEW MICROSCOPY - EXPERIMENTAL INVESTIGATION OF THE DEPENDENCEOF THE OPTICAL SECTIONING CHARACTERISTICS ON PINHOLE-ARRAY CONFIGURATION, Journal of Microscopy, 187, 1997, pp. 54-61
Authors:
LOGUE FP
FEWER DT
HEWLETT SJ
HEFFERNAN JF
JORDAN C
REES P
DONEGAN JF
MCCABE EM
HEGARTY J
TANIGUCHI S
HINO T
NAKANO K
ISHIBASHI A
Citation: Fp. Logue et al., OPTICAL MEASUREMENT OF THE AMBIPOLAR DIFFUSION LENGTH IN A ZNCDSE-ZNSE SINGLE-QUANTUM-WELL, Journal of applied physics, 81(1), 1997, pp. 536-538