Authors: HEISER T MCHUGO S HIESLMAIR H WEBER ER

Citation: T. Heiser et al., TRANSIENT ION DRIFT DETECTION OF LOW-LEVEL COPPER CONTAMINATION IN SILICON, Applied physics letters, 70(26), 1997, pp. 3576-3578

Authors: MCHUGO S GILBERT C

Citation: S. Mchugo et C. Gilbert, UNIVERSITY-STUDENTS HONOR PROFESSORS WITH EXCELLENCE IN TEACHING AWARDS, MRS bulletin, 21(7), 1996, pp. 79-79