Authors:
WIJEWARNASURIYA PS
ZANDIAN M
EDWALL DD
MCLEVIGE WV
CHEN CA
PASKO JG
HILDEBRANDT G
CHEN AC
ARIAS JM
DSOUZA AI
RUJIRAWAT S
SIVANATHAN S
Citation: Ps. Wijewarnasuriya et al., MBE P-ON-N HG1-XCDXTE HETEROSTRUCTURE DETECTORS ON SILICON SUBSTRATES, Journal of electronic materials, 27(6), 1998, pp. 546-549
Authors:
EDWALL DD
DEWAMES RE
MCLEVIGE WV
PASKO JG
ARIAS JM
Citation: Dd. Edwall et al., MEASUREMENT OF MINORITY-CARRIER LIFETIME IN N-TYPE MBE HGCDTE AND ITSDEPENDENCE ON ANNEALING, Journal of electronic materials, 27(6), 1998, pp. 698-702
Authors:
BUBULAC LO
TENNANT WE
PASKO JG
KOZLOWSKI LJ
ZANDIAN M
MOTAMEDI ME
DEWAMES RE
BAJAJ J
NAYAR N
MCLEVIGE WV
GLUCK NS
MELENDES R
COOPER DE
EDWALL DD
ARIAS JM
HALL R
DSOUZA AI
Citation: Lo. Bubulac et al., HIGH-PERFORMANCE SWIR HGCDTE DETECTOR ARRAYS, Journal of electronic materials, 26(6), 1997, pp. 649-655
Authors:
DSOUZA AI
DAWSON LC
ANDERSON EJ
MARKUM AD
TENNANT WE
BUBULAC LO
ZANDIAN M
PASKO JG
MCLEVIGE WV
EDWALL DD
DERR JW
JANDIK JE
Citation: Ai. Dsouza et al., VSWIR TO VLWIR MBE GROWN HGCDTE MATERIAL AND DETECTORS FOR REMOTE-SENSING APPLICATIONS, Journal of electronic materials, 26(6), 1997, pp. 656-661
Authors:
BUBULAC LO
BAJAJ J
TENNANT WE
ZANDIAN M
PASKO J
MCLEVIGE WV
Citation: Lo. Bubulac et al., CHARACTERISTICS AND UNIFORMITY OF GROUP-V IMPLANTED AND ANNEALED HGCDTE HETEROSTRUCTURE, Journal of electronic materials, 25(8), 1996, pp. 1312-1317
Authors:
KOZLOWSKI LJ
MCLEVIGE WV
CABELLI SA
VANDERWYCK AHB
COOPER DE
BLAZEJEWSKI ER
VURAL K
TENNANT WE
Citation: Lj. Kozlowski et al., ATTAINMENT OF HIGH-SENSITIVITY AT ELEVATED OPERATING TEMPERATURES WITH STARING HYBRID HGCDTE-ON-SAPPHIRE FOCAL-PLANE ARRAYS, Optical engineering, 33(3), 1994, pp. 704-715
Authors:
MCLEVIGE WV
WILLIAMS GM
DEWAMES RE
BAJAJ J
GERGIS IS
VANDERWYCK AH
BLAZEJEWSKI ER
Citation: Wv. Mclevige et al., VARIABLE-AREA DIODE DATA-ANALYSIS OF SURFACE AND BULK EFFECTS IN MWIRHGCDTE CDTE SAPPHIRE PHOTODETECTORS, Semiconductor science and technology, 8(6), 1993, pp. 946-952