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Results:
1-9
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Results: 9
Authors:
MITURA Z
DUDAREV SL
WHELAN MJ
Citation: Z. Mitura et al., THEORETICAL-ANALYSIS OF RHEED INTENSITIES FOR GROWING SURFACES, Surface review and letters, 5(3-4), 1998, pp. 701-709
Authors:
MITURA Z
DUDAREV SL
WHELAN MJ
Citation: Z. Mitura et al., PHASE OF RHEED OSCILLATIONS, Physical review. B, Condensed matter, 57(11), 1998, pp. 6309-6312
Authors:
MITURA Z
BEEBY JL
Citation: Z. Mitura et Jl. Beeby, THEORETICAL-STUDIES ON THE QUANTITATIVE INTERPRETATION OF RHEED DATA, Journal of physics. Condensed matter, 8(45), 1996, pp. 8717-8731
Authors:
MITURA Z
MAZUREK P
PAPROCKI K
MIKOLAJCZAK P
BEEBY JL
Citation: Z. Mitura et al., IN-SITU CHARACTERIZATION OF EPITAXIALLY GROWN THIN-LAYERS, Physical review. B, Condensed matter, 53(15), 1996, pp. 10200-10208
Authors:
MITURA Z
MAZUREK P
PAPROCKI K
MIKOLAJCZAK P
Citation: Z. Mitura et al., INVESTIGATIONS OF A NEW METHOD TO CONTROL THIN-FILM GROWTH, Applied physics A: Materials science & processing, 60(2), 1995, pp. 227-231
Authors:
MAZUREK P
MITURA Z
PAPROCKI K
SUBOTOWICZ M
MIKOLAJCZAK P
Citation: P. Mazurek et al., DIRECT OBSERVATION OF RARE-EARTH SILICIDE EPILAYER FORMATION BY RHEEDTECHNIQUE, Vacuum, 46(5-6), 1995, pp. 531-535
Authors:
STROZAK M
MITURA Z
JALOCHOWSKI M
SUBOTOWICZ M
Citation: M. Strozak et al., RHEED INTENSITY OSCILLATIONS DURING THE GROWTH OF PB-IN FILMS ON SI(111) WITH MODIFIED SURFACE, Vacuum, 45(2-3), 1994, pp. 303-305
Authors:
MAKSYM PA
MITURA Z
KNIBB MG
Citation: Pa. Maksym et al., RHEED OSCILLATIONS AT SPECIAL DIFFRACTION CONDITIONS, Surface science, 298(2-3), 1993, pp. 293-298
Authors:
MITURA Z
MAKSYM PA
Citation: Z. Mitura et Pa. Maksym, ANALYSIS OF REFLECTION HIGH-ENERGY ELECTRON-DIFFRACTION AZIMUTHAL PLOTS, Physical review letters, 70(19), 1993, pp. 2904-2907
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1-9
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