Citation: Yb. Moon et al., AEWS - AN INTEGRATED KNOWLEDGE-BASED SYSTEM WITH NEURAL NETWORKS FOR RELIABILITY PREDICTION, Computers in industry, 35(2), 1998, pp. 101-108
Citation: Sk. Si et al., DEEP LEVELS IN HEAVILY ZN-DOPED INP LAYERS IMPLANTED WITH TI AND TI P/, Journal of applied physics, 83(4), 1998, pp. 2366-2368
Citation: Y. Kao et Yb. Moon, FEATURE-BASED MEMORY ASSOCIATION FOR GROUP TECHNOLOGY, International Journal of Production Research, 36(6), 1998, pp. 1653-1677
Citation: Y. Kao et Yb. Moon, PART FAMILY FORMATION BY MEMORY ASSOCIATION, International journal, advanced manufacturing technology, 13(9), 1997, pp. 649-657
Citation: Rv. Dasari et Yb. Moon, ANALYSIS OF PART FAMILIES FOR GROUP TECHNOLOGY APPLICATIONS USING DECISION TREES, International journal, advanced manufacturing technology, 13(2), 1997, pp. 116-124
Citation: Tw. Lee et al., ASYMMETRIC GROWTH-BEHAVIOR OF SELECTIVELY GROWN INP ON VICINAL (100)SURFACES BY LOW-PRESSURE METALORGANIC CHEMICAL-VAPOR-DEPOSITION, Journal of crystal growth, 182(3-4), 1997, pp. 299-308
Citation: M. Srinivasan et Yb. Moon, A FRAMEWORK FOR A GOAL-DRIVEN APPROACH TO GROUP TECHNOLOGY APPLICATIONS USING CONCEPTUAL CLUSTERING, International Journal of Production Research, 35(3), 1997, pp. 847-866
Citation: Jh. Lee et al., BANDGAP TUNING OF IN0.53GA0.47AS INP MULTIQUANTUM-WELL STRUCTURE BY IMPURITY FREE VACANCY DIFFUSION USING IN0.53GA0.47AS CAP LAYER AND SIO2DIELECTRIC CAPPING/, Electronics Letters, 33(13), 1997, pp. 1179-1181