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Authors: MOUNIB A BALESTRA F MATHIEU N BRINI J GHIBAUDO G CHOVET A CHANTRE A NOUAILHAT A

Citation: A. Mounib et al., LOW-FREQUENCY NOISE SOURCES IN POLYSILICON EMITTER BJTS - INFLUENCE OF HOT-ELECTRON-INDUCED DEGRADATION AND POSTSTRESS RECOVERY, I.E.E.E. transactions on electron devices, 42(9), 1995, pp. 1647-1652