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Results: 1
Hole and electron trapping in ion implanted thermal oxides and SIMOX
Authors:
Mrstik, BJ Hughes, HL McMarr, PJ Lawrence, RK Ma, DI Isaacson, IP Walker, RA
Citation:
Bj. Mrstik et al., Hole and electron trapping in ion implanted thermal oxides and SIMOX, IEEE NUCL S, 47(6), 2000, pp. 2189-2195
Risultati:
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