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Results:
1-3
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Results: 3
Direct patterning of gold oxide thin films by focused ion-beam irradiation
Authors:
Machalett, F Edinger, K Melngailis, J Diegel, M Steenbeck, K Steinbeiss, E
Citation:
F. Machalett et al., Direct patterning of gold oxide thin films by focused ion-beam irradiation, APPL PHYS A, 71(3), 2000, pp. 331-335
Accurate location and marking of grain boundaries using focused ion and electron beams
Authors:
Machalett, F Edinger, K Melngailis, J Seidel, P Venkatesan, T
Citation:
F. Machalett et al., Accurate location and marking of grain boundaries using focused ion and electron beams, NUCL INST B, 170(3-4), 2000, pp. 474-482
Focused-ion-beam writing of electrical connections into platinum oxide films
Authors:
Machalett, F Edinger, K Ye, L Melngailis, J Venkatesan, T Diegel, M Steenbeck, K
Citation:
F. Machalett et al., Focused-ion-beam writing of electrical connections into platinum oxide films, APPL PHYS L, 76(23), 2000, pp. 3445-3447
Risultati:
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