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Citation: R. Haberkern et al., Electronic transport properties of quasicrystalline thin films, MAT SCI E A, 294, 2000, pp. 475-480

Authors: Madel, C Schwalbe, G Haberkern, R Haussler, P

Citation: C. Madel et al., Hume-Rothery effects in amorphous and quasicrystalline Al-Cu-Fe, MAT SCI E A, 294, 2000, pp. 535-538