Authors:
Salluzzo, M
Aruta, C
Maggio-Aprile, I
Fischer, O
Bals, S
Zegenhagen, J
Citation: M. Salluzzo et al., Growth of R1+xBa2-xCu3O7-delta epitaxial films investigated by in situ scanning tunneling microscopy, PHYS ST S-A, 186(3), 2001, pp. 339-364
Authors:
Bals, S
Van Tendeloo, G
Salluzzo, M
Maggio-Aprile, I
Citation: S. Bals et al., Why are sputter deposited Nd1+xBa2-xCu3O7-delta thin films flatter than NdBa2Cu3O7-delta films?, APPL PHYS L, 79(22), 2001, pp. 3660-3662
Authors:
Granozio, FM
Salluzzo, M
di Uccio, US
Maggio-Aprile, I
Fischer, O
Citation: Fm. Granozio et al., Competition between alpha-axis and c-axis growth in superconducting RBa2Cu3O7-x thin films, PHYS REV B, 61(1), 2000, pp. 756-765
Authors:
Maggio-Aprile, I
Renner, C
Erb, A
Walker, E
Revaz, B
Genoud, JY
Kadowaki, K
Fischer, O
Citation: I. Maggio-aprile et al., Temperature dependence of tunneling spectra in YBa2Cu3O7-delta and Bi2Sr2CaCu2O8+delta single crystals, J ELEC SPEC, 109(1-2), 2000, pp. 147-155
Authors:
Grevin, B
Maggio-Aprile, I
Bentzen, A
Ranno, L
Llobet, A
Fischer, O
Citation: B. Grevin et al., Local electronic transport in La0.7Sr0.3MnO3 thin films studied by scanning tunneling potentiometry, PHYS REV B, 62(13), 2000, pp. 8596-8599
Authors:
Salluzzo, M
Palomba, F
Pica, G
Andreone, A
Maggio-Aprile, I
Fischer, O
Cantoni, C
Norton, DP
Citation: M. Salluzzo et al., Role of Nd/Ba disorder on the penetration depth of Nd1+xBa2-xCu3O7-delta thin films, PHYS REV L, 85(5), 2000, pp. 1116-1119
Authors:
Kuffer, O
Maggio-Aprile, I
Triscone, JM
Fischer, O
Renner, C
Citation: O. Kuffer et al., Piezoelectric response of epitaxial Pb(Zr0.2Ti0.8)O-3 films measured by scanning tunneling microscopy, APPL PHYS L, 77(11), 2000, pp. 1701-1703
Citation: M. Salluzzo et al., Improved structural properties and surface morphology of Nd1+xBa2-xCu3O7-delta thin films deposited by d.c. magnetron sputtering, IEEE APPL S, 9(2), 1999, pp. 1856-1859
Citation: M. Salluzzo et al., Properties of superconducting Nd1+xBa2-xCu3O7-delta thin films deposited by dc magnetron sputtering, APPL PHYS L, 73(5), 1999, pp. 683-685
Citation: C. Renner et al., Vortex lattice imaging and spectroscopic studies of flux lines by scanningtunneling microscopy, SER DIRECT, 13, 1998, pp. 226-244