Authors:
Krieg, J
Turflinger, T
Titus, J
Cole, P
Baker, P
Gehlhausen, M
Emily, D
Yang, L
Pease, RL
Barnaby, H
Schrimpf, R
Maher, MC
Citation: J. Krieg et al., Hardness assurance implications of bimodal total dose response in a bipolar linear voltage comparator, IEEE NUCL S, 46(6), 1999, pp. 1627-1632
Authors:
Barnaby, HJ
Schrimpf, RD
Pease, RL
Cole, P
Turflinger, T
Krieg, J
Titus, J
Emily, D
Gehlhausen, M
Witczak, SC
Maher, MC
Van Nort, D
Citation: Hj. Barnaby et al., Identification of degradation mechanisms in a bipolar linear voltage comparator through correlation of transistor and circuit response, IEEE NUCL S, 46(6), 1999, pp. 1666-1673