Authors: Maiwa, H Ichinose, N

Citation: H. Maiwa et N. Ichinose, Electrical and electromechanical properties of PbZrO3 thin films prepared by chemical solution deposition, JPN J A P 1, 40(9B), 2001, pp. 5507-5510

Authors: Maiwa, H Ichinose, N

Citation: H. Maiwa et N. Ichinose, Preparation and properties of Al1-xTixN solid solution thin films by multiple cathode sputtering, J EUR CERAM, 21(10-11), 2001, pp. 1573-1576

Authors: Maiwa, H Ichinose, N

Citation: H. Maiwa et N. Ichinose, Measurement of electric-field-induced displacements in (Pb, La)TiO3 thin films using scanning probe microscopy, JPN J A P 1, 39(9B), 2000, pp. 5403-5407

Authors: Christman, JA Kim, SH Maiwa, H Maria, JP Rodriguez, BJ Kingon, AI Nemanich, RJ

Citation: Ja. Christman et al., Spatial variation of ferroelectric properties in Pb(Zr-0.3, Ti-0.7)O-3 thin films studied by atomic force microscopy, J APPL PHYS, 87(11), 2000, pp. 8031-8034

Authors: Maiwa, H Christman, JA Kim, SH Kim, DJ Maria, JP Chen, B Streiffer, SK Kingon, AI

Citation: H. Maiwa et al., Measurement of piezoelectric displacements of Pb(Zr, Ti)O-3 thin films using a double-beam interferometer, JPN J A P 1, 38(9B), 1999, pp. 5402-5405

Authors: Maiwa, H Maria, JP Christman, JA Kim, SH Streiffer, K Kingon, AI

Citation: H. Maiwa et al., Measurement and calculation of PZT thin film longitudinal piezoelectric coefficients, INTEGR FERR, 24(1-4), 1999, pp. 139-146