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Citation: A. Mallikarjunan et al., Metal drift behavior in low dielectric constant organosiloxane polymer, APPL PHYS L, 79(12), 2001, pp. 1855-1857

Authors: Mallikarjunan, A Sharma, S Murarka, SP

Citation: A. Mallikarjunan et al., Resistivity of copper films at thicknesses near the mean free path of electrons in copper - Minimization of the diffuse scattering in copper, EL SOLID ST, 3(9), 2000, pp. 437-438

Authors: Mallikarjunan, A Murarka, SP Steinbruchel, C Kumar, A Bakhru, H

Citation: A. Mallikarjunan et al., Electrical behavior of Cu thin fluorinated PECVD oxide MIS capacitors, J ELCHEM SO, 147(9), 2000, pp. 3502-3507