Authors:
Briantseva, TA
Lebedeva, ZM
Lioubtchenko, DV
Markov, IA
Nolan, M
Perova, TS
Moore, RA
Citation: Ta. Briantseva et al., Precise chemical analysis development for silicon wafers after rapid thermal processing, APPL SURF S, 156(1-4), 2000, pp. 21-25
Authors:
Briantseva, TA
Lebedeva, ZM
Markov, IA
Bullough, TJ
Lioubtchenko, DV
Citation: Ta. Briantseva et al., Process-induced modification to the surface of crystalline GaAs measured by photometry, APPL SURF S, 143(1-4), 1999, pp. 223-228
Authors:
Baryshnikov, FF
Bogatova, GA
Kalinin, YA
Markov, IA
Madey, JMJ
Prebeinos, VV
Szarmes, EB
Cheburkin, NV
Cherenkov, SA
Citation: Ff. Baryshnikov et al., A broadband tunable scanning IR Fabry-Perot interferometer for free-electron lasers, INSTR EXP R, 42(5), 1999, pp. 662-665