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Results: 1-4 |
Results: 4

Authors: Briantseva, TA Lebedeva, ZM Lioubtchenko, DV Markov, IA Nolan, M Perova, TS Moore, RA
Citation: Ta. Briantseva et al., Precise chemical analysis development for silicon wafers after rapid thermal processing, APPL SURF S, 156(1-4), 2000, pp. 21-25

Authors: Briantseva, TA Bullough, TJ Lioubtchenko, DV Markov, IA Tolmachev, EM
Citation: Ta. Briantseva et al., SAW diagnostics of GaAs surface structure, PHYSICA B, 263, 1999, pp. 84-86

Authors: Briantseva, TA Lebedeva, ZM Markov, IA Bullough, TJ Lioubtchenko, DV
Citation: Ta. Briantseva et al., Process-induced modification to the surface of crystalline GaAs measured by photometry, APPL SURF S, 143(1-4), 1999, pp. 223-228

Authors: Baryshnikov, FF Bogatova, GA Kalinin, YA Markov, IA Madey, JMJ Prebeinos, VV Szarmes, EB Cheburkin, NV Cherenkov, SA
Citation: Ff. Baryshnikov et al., A broadband tunable scanning IR Fabry-Perot interferometer for free-electron lasers, INSTR EXP R, 42(5), 1999, pp. 662-665
Risultati: 1-4 |