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Results: 1-25/31
Authors:
Marks, LD
Dollahite, DC
Citation: Ld. Marks et Dc. Dollahite, Religion, relationships, and responsible fathering in Latter-day Saint families of children with special needs, J SOC PERS, 18(5), 2001, pp. 625-650
Authors:
Kumpf, C
Smilgies, D
Landemark, E
Nielsen, M
Feidenhans'l, R
Bunk, O
Zeysing, JH
Su, Y
Johnson, RL
Cao, L
Zegenhagen, J
Fimland, BO
Marks, LD
Ellis, D
Citation: C. Kumpf et al., Structure of metal-rich (001) surfaces of III-V compound semiconductors - art. no. 075307, PHYS REV B, 6407(7), 2001, pp. 5307
Authors:
Bengu, E
Salud, M
Marks, LD
Citation: E. Bengu et al., Model-independent inversion of x-ray or neutron reflectivity data - art. no. 195414, PHYS REV B, 6319(19), 2001, pp. 5414
Authors:
Chukhovskii, FN
Hu, JJ
Marks, LD
Citation: Fn. Chukhovskii et al., Statistical dynamical direct methods. II. The three-phase structure invariant, ACT CRYST A, 57, 2001, pp. 231-239
Authors:
Kumpf, C
Marks, LD
Ellis, D
Smilgies, D
Landemark, E
Nielsen, M
Feidenhans, R
Zegenhagen, J
Bunk, O
Zeysing, JH
Su, Y
Johnson, RL
Citation: C. Kumpf et al., Subsurface dimerization in III-V semiconductor (001) surfaces, PHYS REV L, 86(16), 2001, pp. 3586-3589
Authors:
Bengu, E
Marks, LD
Citation: E. Bengu et Ld. Marks, Single-walled BN nanostructures, PHYS REV L, 86(11), 2001, pp. 2385-2387
Authors:
Kim, IW
Li, Q
Marks, LD
Barnett, SA
Citation: Iw. Kim et al., Critical thickness for transformation of epitaxially stabilized cubic AlN in superlattices, APPL PHYS L, 78(7), 2001, pp. 892-894
Authors:
Gai, PL
Boyes, ED
Carter, CB
Cockayne, DJH
Marks, LD
Pennycook, SJ
Citation: Pl. Gai et al., Celebrations in pioneering electron microscopy: A symposium in honor of Professor Archie Howie - Introduction, MICROS MICR, 6(4), 2000, pp. 281-284
Authors:
Marks, LD
Citation: Ld. Marks, New methods for determining surface structures, J MOL CAT A, 158(1), 2000, pp. 85-89
Authors:
Li, Q
Yu, YH
Bhatia, CS
Marks, LD
Lee, SC
Chung, YW
Citation: Q. Li et al., Low-temperature magnetron sputter-deposition, hardness, and electrical resistivity of amorphous and crystalline alumina thin films, J VAC SCI A, 18(5), 2000, pp. 2333-2338
Authors:
Hu, JJ
Chukhovskii, FN
Marks, LD
Citation: Jj. Hu et al., Statistical dynamical direct methods. I. The effective kinematical approximation, ACT CRYST A, 56, 2000, pp. 458-469
Authors:
Erdman, N
Warschkow, O
Ellis, DE
Marks, LD
Citation: N. Erdman et al., Solution of the p(2 x 2) NiO(111) surface structure using direct methods, SURF SCI, 470(1-2), 2000, pp. 1-14
Authors:
Grozea, D
Bengu, E
Marks, LD
Citation: D. Grozea et al., Surface phase diagrams for the Ag-Ge(111) and Au-Si(111) systems, SURF SCI, 461(1-3), 2000, pp. 23-30
Authors:
Edwards, DD
Mason, TO
Sinkler, W
Marks, LD
Poeppelmeier, KR
Hu, Z
Jorgensen, JD
Citation: Dd. Edwards et al., Tunneled intergrowth structures in the Ga2O3-In2O3-SnO2 system, J SOL ST CH, 150(2), 2000, pp. 294-304
Authors:
Carmody, M
Moeckly, BH
Merkle, KL
Marks, LD
Citation: M. Carmody et al., Spatial variation of the current in grain boundary Josephson junctions, J APPL PHYS, 87(5), 2000, pp. 2454-2459
Authors:
Leslie, C
Landree, E
Collazo-Davila, C
Bengu, E
Grozea, D
Marks, LD
Citation: C. Leslie et al., Electron crystallography in surface structure analysis, MICROSC RES, 46(3), 1999, pp. 160-177
Authors:
Sinkler, W
Marks, LD
Citation: W. Sinkler et Ld. Marks, Application of direct methods for crystal structure determination using strongly dynamical bulk electron diffraction, MATER CHAR, 42(4-5), 1999, pp. 283-295
Authors:
Grozea, D
Landree, E
Collazo-Davila, C
Bengu, E
Plass, R
Marks, LD
Citation: D. Grozea et al., Structural investigations of metal-semiconductor surfaces, MICRON, 30(1), 1999, pp. 41-49
Authors:
Collazo-Davila, C
Bengu, E
Marks, LD
Kirk, M
Citation: C. Collazo-davila et al., Nucleation of cubic boron nitride thin films, DIAM RELAT, 8(6), 1999, pp. 1091-1100
Authors:
Carmody, M
Landree, E
Marks, LD
Merkle, KL
Citation: M. Carmody et al., Determination of the current density distribution in Josephson junctions, PHYSICA C, 315(3-4), 1999, pp. 145-153
Authors:
Sinkler, W
Marks, LD
Citation: W. Sinkler et Ld. Marks, Dynamical direct methods for everyone, ULTRAMICROS, 75(4), 1999, pp. 251-268
Authors:
Grozea, D
Bengu, E
Collazo-Davila, C
Marks, LD
Citation: D. Grozea et al., Structure determination of the Ge(111)-(3x1)Ag surface reconstruction, SURF REV L, 6(6), 1999, pp. 1061-1065
Authors:
Marks, LD
Citation: Ld. Marks, General solution for three-dimensional surface structures using direct methods, PHYS REV B, 60(4), 1999, pp. 2771-2780
Authors:
Marks, LD
Citation: Ld. Marks, Picometer structure determination using electron diffraction, SCANNING, 21(2), 1999, pp. 96-96
Authors:
Li, Q
Barnett, SA
Marks, LD
Citation: Q. Li et al., Phase transformation of AlN in AlN VN superlattice, SCANNING, 21(2), 1999, pp. 158-159