Authors:
Oakey, J
Marr, DWM
Schwartz, KB
Wartenberg, M
Citation: J. Oakey et al., An integrated AFM and SANS approach toward understanding void formation inconductive composite materials, MACROMOLEC, 33(14), 2000, pp. 5198-5203
Citation: K. Swaminathan et Dwm. Marr, Morphology characterization of high-impact resistant polypropylene using AFM and SALS, J APPL POLY, 78(2), 2000, pp. 452-457
Authors:
Oakey, J
Marr, DWM
Schwartz, KB
Wartenberg, M
Citation: J. Oakey et al., Influence of polyethylene and carbon black morphology on void formation inconductive composite materials: A SANS study, MACROMOLEC, 32(16), 1999, pp. 5399-5404