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Results: 3
Exploring capabilities of electrical linewidth measurement (ELM) techniques
Authors: Rangelov, V Sarstedt, M Somerville, J Marschner, T Jonckheere, R Poelaert, A
Citation: V. Rangelov et al., Exploring capabilities of electrical linewidth measurement (ELM) techniques, MICROEL ENG, 57-8, 2001, pp. 673-681
Strain-driven transition from stepped interfaces to regularly spaced macrosteps in (GaIn)As/Ga(PAs) symmetrically strained superlattices
Authors: Giannini, C Baumbach, T Lubbert, D Felici, R Tapfer, L Marschner, T Stolz, W Jin-Phillipp, NY Phillipp, F
Citation: C. Giannini et al., Strain-driven transition from stepped interfaces to regularly spaced macrosteps in (GaIn)As/Ga(PAs) symmetrically strained superlattices, PHYS REV B, 61(3), 2000, pp. 2173-2179
Investigation of strain induced patterning in superlattices by grazing incidence diffraction - comparison of morphological and strain ordering
Authors: Baumbach, GT Giannini, C Lubbert, D Felici, R Tapfer, L Marschner, T Stolz, W
Citation: Gt. Baumbach et al., Investigation of strain induced patterning in superlattices by grazing incidence diffraction - comparison of morphological and strain ordering, J PHYS D, 32(10A), 1999, pp. A212-A215
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