Authors:
Gierak, J
Mailly, D
Faini, G
Pelouard, JL
Denk, P
Pardo, F
Marzin, JY
Septier, A
Schmid, G
Ferre, J
Hydman, R
Chappert, C
Flicstein, J
Gayral, B
Gerard, JM
Citation: J. Gierak et al., Nano-fabrication with focused ion beams, MICROEL ENG, 57-8, 2001, pp. 865-875
Authors:
Schneider, M
Gierak, J
Marzin, JY
Gayral, B
Gerard, JM
Citation: M. Schneider et al., Focused ion beam patterning of III-V crystals at low temperature: A methodfor improving the ion-induced defect localization, J VAC SCI B, 18(6), 2000, pp. 3162-3167
Authors:
Freixanet, T
Sermage, B
Bloch, J
Marzin, JY
Planel, R
Citation: T. Freixanet et al., Annular resonant Rayleigh scattering in the picosecond dynamics of cavity polaritons, PHYS REV B, 60(12), 1999, pp. R8509-R8512