Authors: Fuller, MLS Fernandez, LR Massoumi, GR Lennard, WN Kasrai, M Bancroft, GM

Citation: Mls. Fuller et al., The use of X-ray absorption spectroscopy for monitoring the thickness of antiwear films from ZDDP, TRIBOL LETT, 8(4), 2000, pp. 187-192

Authors: Walker, SR Davies, JA Mascher, P Wallace, SG Lennard, WN Massoumi, GR Elliman, RG Ophel, TR Timmers, H

Citation: Sr. Walker et al., Characterization of silicon oxynitride films using ion beam analysis techniques, NUCL INST B, 170(3-4), 2000, pp. 461-466

Authors: Lennard, WN Massoumi, GR Simpson, TW Mitchell, IV

Citation: Wn. Lennard et al., Improved stoichiometry measurements using He-4 elastic backscattering: experiment and simulation, NUCL INST B, 152(2-3), 1999, pp. 370-376

Authors: Xia, H Rodriguez-Fernandez, L Lennard, WN Massoumi, GR Dimov, S Chryssoulis, S

Citation: H. Xia et al., Range distribution of P-31 ions implanted into Ge, NUCL INST B, 149(1-2), 1999, pp. 1-6