Login
|
New Account
AAAAAA
ITA
ENG
Results:
1-2
|
Results: 2
Effect of substrate doping profile on C-V curves for thin MOS capacitors
Authors:
Simonetti, O Maurel, T Jourdain, M
Citation:
O. Simonetti et al., Effect of substrate doping profile on C-V curves for thin MOS capacitors, EPJ-APPL PH, 14(2), 2001, pp. 127-130
Extraction of the oxide thickness using a MOS structure quantum model for SiO2 oxide < 5 nm thick films
Authors:
Simonetti, O Maurel, T Jourdain, M
Citation:
O. Simonetti et al., Extraction of the oxide thickness using a MOS structure quantum model for SiO2 oxide < 5 nm thick films, J NON-CRYST, 280(1-3), 2001, pp. 110-115
Risultati:
1-2
|