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Results: 2

Authors: Simonetti, O Maurel, T Jourdain, M
Citation: O. Simonetti et al., Effect of substrate doping profile on C-V curves for thin MOS capacitors, EPJ-APPL PH, 14(2), 2001, pp. 127-130

Authors: Simonetti, O Maurel, T Jourdain, M
Citation: O. Simonetti et al., Extraction of the oxide thickness using a MOS structure quantum model for SiO2 oxide < 5 nm thick films, J NON-CRYST, 280(1-3), 2001, pp. 110-115
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