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Results: 1-3 |
Results: 3
Grain size distribution analysis in polycrystalline LiF thin films by mathematical morphology techniques on AFM images and X-ray diffraction data
Authors: Cremona, M Mauricio, MHP Do Carmo, LCS Prioli, R Nunes, VB Zanette, SI Caride, AO Albuquerque, MP
Citation: M. Cremona et al., Grain size distribution analysis in polycrystalline LiF thin films by mathematical morphology techniques on AFM images and X-ray diffraction data, J MICROSC O, 197, 2000, pp. 260-267
Sputtering and coloration process in LiF thin layers induced by MeV ion bombardment
Authors: Cremona, M Pereira, JAM Mauricio, MHP Do Carmo, LCS Somma, F
Citation: M. Cremona et al., Sputtering and coloration process in LiF thin layers induced by MeV ion bombardment, RADIAT EFF, 149(1-4), 1999, pp. 215-219
Grazing incidence X-ray diffraction analysis of alkali fluoride thin filmsfor optical devices
Authors: Cremona, M Mauricio, MHP Fehlberg, LV Nunes, RA do Carmo, LCS de Avillez, RR Caride, AO
Citation: M. Cremona et al., Grazing incidence X-ray diffraction analysis of alkali fluoride thin filmsfor optical devices, THIN SOL FI, 333(1-2), 1998, pp. 157-164
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